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Posted: Wed Nov 25, 2009 10:18 pm Post subject: Through-The-System fine intolerance scanning
I am the CTO of a new materials technology company manufacturing nanostructures using high-speed laser machining.
My company is looking for a relatively quick method of measuring height intolerances in small target pieces (<50x50mm) to a 1 micron accuracy, and then to output Point Cloud, which we will then convert for laser processing to remove said intolerances.
However, we do NOT want to move the target piece between measurement and processing, and we are looking for a partner company to co-develop Through-The-(laser processing)System 3D scanning.
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